James Baker-Jarvis | Bookhype

Feb 9, 2019

Cover of Measuring the Permittivity and Permeability of Lossy Materials

Measuring the Permittivity and Permeability of Lossy Materials

Dec 23, 2018

Cover of Transmission/Reflection and Short-Circuit Line Permittivity Measurements (Classic Reprint)

Transmission/Reflection and Short-Circuit Line Permittivity Measurements (Classic Reprint)

Oct 10, 2018

Cover of Electrical Properties and Dielectric Relaxation of Dna in Solution (Classic Reprint)

Electrical Properties and Dielectric Relaxation of Dna in Solution (Classic Reprint)

Sep 13, 2018

Cover of Characterization of Tissue-Equivalent Materials for High-Frequency Applications (200 Mhz to 20 Ghz) (Classic Reprint)

Characterization of Tissue-Equivalent Materials for High-Frequency Applications (200 Mhz to 20 Ghz) (Classic Reprint)

Sep 10, 2018

Cover of Dielectric Measurements Using a Reentrant Cavity

Dielectric Measurements Using a Reentrant Cavity

Jul 31, 2018

Cover of Dielectric and Conductor-Loss Characterization and Measurements on Electronic Packaging Materials (Classic Reprint)

Dielectric and Conductor-Loss Characterization and Measurements on Electronic Packaging Materials (Classic Reprint)

May 8, 2018

Cover of Transmission/Reflection and Short-Circuit Line Methods for Measuring Permittivity and Permeability (Classic Reprint)

Transmission/Reflection and Short-Circuit Line Methods for Measuring Permittivity and Permeability (Classic Reprint)

Apr 24, 2018

Cover of Dielectric and Magnetic Properties of Printed Wiring Boards and Other Substrate Materials (Classic Reprint)

Dielectric and Magnetic Properties of Printed Wiring Boards and Other Substrate Materials (Classic Reprint)

Aug 31, 2004

Cover of Relative Permeability Measurements for Metal-Detector Research

Relative Permeability Measurements for Metal-Detector Research

Mar 30, 2004

Cover of DC Conductivity Measurements of Metals

DC Conductivity Measurements of Metals

Feb 13, 2003

Cover of Metal Detector Studies

Metal Detector Studies (Nist Technical Note, #1514)