David E. Root

2 books • 1 series

David E. Root is Keysight Research Fellow at Keysight Technologies, Inc., and a Fellow of the IEEE. He is a co-author of X-Parameters (Cambridge, 2013) and a co-editor of Nonlinear Transistor Model Parameter Extraction Techniques (Cambridge, 2011).
May 23, 2018
Cover of Nonlinear Circuit Simulation and Modeling

Nonlinear Circuit Simulation and Modeling (The Cambridge RF and Microwave Engineering)

Sep 26, 2013
Cover of X-Parameters

X-Parameters (The Cambridge RF and Microwave Engineering)