Andrei Pavlov | Bookhype

Frontiers in Electronic Testing

Cover of Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Book #34: Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Cover of CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies

Book #40: CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies

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