Jose Pineda de Gyvez | Bookhype

Analog Circuits and Signal Processing

Frontiers in Electronic Testing

Cover of Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Book #34: Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Cover of CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies

Book #40: CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies

The Springer International Series in Engineering and Computer Science

Cover of Integrated Circuit Defect-Sensitivity: Theory and Computational Models

Book #208: Integrated Circuit Defect-Sensitivity: Theory and Computational Models