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This volume covers topics including: yield and defect density; reliability enhancement; defect and fault analysis; testing techniques; fault diagnosis; fault-tolerant designs; high-level synthesis of reliable systems; and yield and reliability issues of analogue and mixed signal circuits.

Electrical Engineering/Circuits and Electron Devices Routing in the Third Dimension From VLSI to MCMs Naveed Sherwani, Siddharth Bhingarde, and Anand Panyam A volume in the IEEE Press Series on Microelectronic Systems Stuart K. Tewksbury, Series Editor The complex computer chips of tomorrow will consist of not just one or two but several layers of metal interconnect. This makes the interconnect within a chip or a multichip module a three-dimensional problem. This book addresses the algorithmic a...

Electronics are used in a wide range of applications including computing, communication, biomedical, automotive, military and aerospace. They must operate in varying temperature and humidity environments including indoor controlled conditions and outdoor climate changes. Moisture, ionic contamination, heat, radiation and mechanical stresses are all highly detrimental to electronic devices and can lead to device failures. Therefore, it is essential that the electronic devices be packaged for prot...

With asynchronous circuit design becoming a powerful tool in the development of new digital systems, circuit designers are expected to have asynchronous design skills and be able to leverage them to reduce power consumption and increase system speed. This book walks readers through all of the different methodologies of asynchronous circuit design, emphasizing practical techniques and real-world applications instead of theoretical simulation. The only guide of its kind, it also features an ftp si...

To surmount the continuous scaling challenges of MOSFET devices, FinFETs have emerged as the real alternative for use as the next generation device for IC fabrication technology. The objective of this book is to provide the basic theory and operating principles of FinFET devices and technology, an overview of FinFET device architecture and manufacturing processes, and detailed formulation of FinFET electrostatic and dynamic device characteristics for IC design and manufacturing. Thus, this book...

Driven by advanced CMOS technology, power management units, RF transceivers, and sensors, analog and mixed-signal circuits can now be fully integrated with VLSI digital systems for applications ranging from mobile, internet-of-things (IoT), wearable, and implantable medical devices. Evidently, the circuit- and system-level innovations have pushed the device performance boundaries to become orders of magnitude higher, whilst keeping the same or even lower power consumption. Selected Topic in Pow...

Presents modern CMOS logic circuits, fabrication, and layout in a cohesive manner that links the material together with the system-level considerations. Chapter on Verilog HDL allows for rapid start-up. Illustrates the top-down design procedure used in modern VLSI chip design with an emphasis on variations in the HDL, logic, circuits and layout.

Electrical Engineering/Signal Processing High - Performance VLSI Signal Processing Innovative Architectures and Algorithms Volume 1 Algorithms and Architectures The first volume in a two-volume set, High-Performance VLSI Signal Processing: Innovative Architectures and Algorithms brings together the most innovative papers in the field, focused introductory material, and extensive references. The editors present timely coverage of algorithm and design methodologies with an emphasis on today's rapi...

There is a common core to the behaviour and technology of semi-conductor materials. Silicon and gallium arsenide are two materials particularly suited to Very Large Scale Integrated schemes (VLSI). Produced from a decade's worth of feedback from students and industry colleagues, this new edition integrates discussion of elemental (silicon) and compound (gallium arsenide) technologies. The book emphasizes fabrication principles for such circuits as CMOS, BiPolar, MOS and PET. These different tech...

This book provides the reader with knowledge on a wide variety of radiation fields and their effects on the electronic devices and systems. The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including electrons, alpha-rays, muons, gamma rays, neutrons and heavy ions. Readers will learn how to make numerical models from physical insights, to determine the kind of mathematical approaches that should be implemented to analyze radiation effects. A wi...

VLSI, or Very-Large-Scale-Integration, is the practice of combining billions of transistors to create an integrated circuit. At present, VLSI circuits are realised using CMOS technology. However, the demand for ever smaller, more efficient circuits is now pushing the limits of CMOS. Post-CMOS refers to the possible future digital logic technologies beyond the CMOS scaling limits. This 2-volume set addresses the current state of the art in VLSI technologies and presents potential options for post...

Aimed at researchers, professors, practitioners, students and other computing professionals, this work looks at low power circuits and architectures, VLSI circuits, VLSI architectures, methodologies and CAD tools and database for CAD.

This work contains the proceedings from the 16th IEEE VLSI Test Symposium. Subjects covered include: core and processor test; RAM test; BIST; current testing techniques; delay test and diagnosis; fault modeling and parametric test; and analog test sequential circuits test concurrent checking.

Proceedings of ICCD 91, held in Cambridge, Massachusetts, October 1991. A notable feature is the inclusion of the best papers from the International Logic Synthesis Workshop. A second distinctive feature is the conference's breadth linking CAD, architecture, design and test, and technology. Annotati