Transient Electromagnetic-Thermal Nondestructive Testing: Pulsed Eddy Current and Transient Eddy Current Thermography

by Yunze He, Bin Gao, Ali Sophian, and Ruizhen Yang

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Book cover for Transient Electromagnetic-Thermal Nondestructive Testing

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Transient Electromagnetic-Thermal Nondestructive Testing: Pulsed Eddy Current and Transient Eddy Current Thermography covers three key areas of theories, methods and applications, primarily the multi-physics field, including eddy current, heat conduction and Infrared radiation for defect evaluation, lateral heat conduction, which is analyzed to detect parallel cracks, and longitudinal heat conduction, which is analyzed to detect depth defect, or that which is beyond skin depth.

In addition, the book explores methods, such as time domain, frequency domain and logarithm domain, also comparing A-scan , B-scan and C-scan. Sections on defect identification, classification and quantification are covered, as are advanced algorithms, principal components analysis (PCA), independent components analysis (ICA) and support vector machine (SVM).

The book uses a lot of experimental studies on multi-layer aluminum structures, honeycomb structure, CFRP in the aerospace field, and steel and coating in the marine rail and transportation fields.
  • ISBN13 9780128127872
  • Publish Date 29 May 2017
  • Publish Status Active
  • Publish Country US
  • Imprint Elsevier Science Publishing Co Inc
  • Format Paperback
  • Pages 374
  • Language English