X-Ray scattering is one of the most powerful tools in the study of the structure of the wide class of polymeric materials in which partial crystallization occurs. The scattering at wide angles provides information on the unit cell variations, the crystallinity, the crystalline perfection and the orientation of the crystallites, whereas the scattering at small angles is specially suited to a description of the crystalline-amorphous morphology. As a result of scientific advances and industrial interest in polymers, progress in constantly being made in the application of X-ray scattering to these materials. This book describes the current state-of-the-art of the application of X-ray scattering to the study of solid polymer materials. As well as chapters on theory and instrumentation, the book covers subjects concerning the measurement of lattice constants, the crystalline perfection, the degree of crystallinity and the description of preferred orientation. In addition, special emphasis is given to the study of the crystalline morphology with the aid of small-angle X-ray scattering, giving both theoretical background and practical information.
- ISBN10 0444873856
- ISBN13 9780444873859
- Publish Date April 1989
- Publish Status Out of Print
- Out of Print 4 December 2011
- Publish Country GB
- Publisher Taylor & Francis Ltd
- Imprint Elsevier Science Ltd
- Format Hardcover
- Pages 330
- Language English